Исследование собственных и примесных точечных дефектов в сапфировых подложках люминесцентными методами
This work is devoted to the study of intrinsic and impurity point defects in sapphire substrates and raw materials using luminescence methods. It is proposed to employ luminescence under various types of excitation as a sensitive and informative rapid technique for detecting intrinsic and impurity p...
Збережено в:
| Дата: | 2006 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | Українська |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2006
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2006.3.59 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | This work is devoted to the study of intrinsic and impurity point defects in sapphire substrates and raw materials using luminescence methods. It is proposed to employ luminescence under various types of excitation as a sensitive and informative rapid technique for detecting intrinsic and impurity point defects in sapphire crystals and substrates. |
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