X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

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Datum:2010
Hauptverfasser: V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich
Format: Artikel
Sprache:Englisch
Veröffentlicht: 2010
Schriftenreihe:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000349116
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
author_facet V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
author_sort V. P. Kladko
collection Open-Science
first_indexed 2025-07-22T15:14:47Z
format Article
id open-sciencenbuvgovua-100038
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
last_indexed 2025-07-22T15:14:47Z
publishDate 2010
record_format dspace
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spelling open-sciencenbuvgovua-1000382024-04-17T17:54:38Z X-ray diffraction study of deformation state in InGaN/GaN multilayered structures V. P. Kladko A. V. Kuchuk N. V. Safryuk V. F. Machulin A. E. Belyaev R. V. Konakova B. S. Yavich 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349116 Article
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_full X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_fullStr X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_full_unstemmed X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_short X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_sort x-ray diffraction study of deformation state in ingan/gan multilayered structures
url http://jnas.nbuv.gov.ua/article/UJRN-0000349116
work_keys_str_mv AT vpkladko xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT avkuchuk xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT nvsafryuk xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT vfmachulin xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT aebelyaev xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT rvkonakova xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT bsyavich xraydiffractionstudyofdeformationstateininganganmultilayeredstructures