X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

Збережено в:
Бібліографічні деталі
Дата:2010
Автори: V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich
Формат: Стаття
Мова:English
Опубліковано: 2010
Назва видання:Semiconductor Physics, Quantum Electronics and Optoelectronics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000349116
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-100038
record_format dspace
spelling open-sciencenbuvgovua-1000382024-04-17T17:54:38Z X-ray diffraction study of deformation state in InGaN/GaN multilayered structures V. P. Kladko A. V. Kuchuk N. V. Safryuk V. F. Machulin A. E. Belyaev R. V. Konakova B. S. Yavich 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349116 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
format Article
author V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
author_facet V. P. Kladko
A. V. Kuchuk
N. V. Safryuk
V. F. Machulin
A. E. Belyaev
R. V. Konakova
B. S. Yavich
author_sort V. P. Kladko
title X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_short X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_full X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_fullStr X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_full_unstemmed X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
title_sort x-ray diffraction study of deformation state in ingan/gan multilayered structures
publishDate 2010
url http://jnas.nbuv.gov.ua/article/UJRN-0000349116
work_keys_str_mv AT vpkladko xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT avkuchuk xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT nvsafryuk xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT vfmachulin xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT aebelyaev xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT rvkonakova xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
AT bsyavich xraydiffractionstudyofdeformationstateininganganmultilayeredstructures
first_indexed 2024-04-18T05:40:25Z
last_indexed 2024-04-18T05:40:25Z
_version_ 1796887718891880448