$X-ray diffraction study of deformation state in InGaN/GaN multilayered structures$

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

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Bibliographic Details
Date:	2010
Main Authors:	V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich
Format:	Article
Language:	English
Published:	2010
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000349116
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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