Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry - I. M. Fodchuk; V. V. Dovganyuk; T. V. Litvinchuk; V. P. Kladko; M. V. Slobodian; Yo. Gudymenko; Z. Swiatek (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2010)