Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry
Saved in:
| Date: | 2010 |
|---|---|
| Main Authors: | I. M. Fodchuk, V. V. Dovganyuk, T. V. Litvinchuk, V. P. Kladko, M. V. Slobodian, Yo. Gudymenko, Z. Swiatek |
| Format: | Article |
| Language: | English |
| Published: |
2010
|
| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000349248 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry
by: Fodchuk, І.М., et al.
Published: (2010) -
X-ray dynamical diffractometry of defect structure of garnet single crystals
by: V. M. Pylypiv, et al.
Published: (2011) -
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
by: Molodkin, V.B., et al.
Published: (2016) -
Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry
by: A. I. Gudymenko, et al.
Published: (2015) -
Research of recombination characteristics of Cz-Si implanted with iron ions
by: D. V. Gamov, et al.
Published: (2013)