Double- and triple-crystal X-ray diffractometry of microdefects in silicon - V. B. Molodkin; S. I. Olikhovskii; Ye. M. Kyslovskyy; E. G. Len; O. V. Reshetnyk; T. P. Vladimirova; V. V. Lizunov; S. V. Lizunova (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2010)