APA (7th ed.) Citation

Stervoedov, A. N., Beresnev, V. M., & Sergeeva, N. V. (2010). Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films.

Chicago Style (17th ed.) Citation

Stervoedov, A. N., V. M. Beresnev, and N. V. Sergeeva. Features of X-ray Photoelectron Spectroscopy for Determining the Thickness of Ultrathin Films. 2010.

MLA (8th ed.) Citation

Stervoedov, A. N., et al. Features of X-ray Photoelectron Spectroscopy for Determining the Thickness of Ultrathin Films. 2010.

Warning: These citations may not always be 100% accurate.