Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films
Збережено в:
| Дата: | 2010 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2010
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| Назва видання: | Physical surface engineering |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000877899 |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-101750 |
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| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-1017502024-04-17T18:06:51Z Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films A. N. Stervoedov V. M. Beresnev N. V. Sergeeva 1999-8074 2010 en Physical surface engineering http://jnas.nbuv.gov.ua/article/UJRN-0000877899 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Physical surface engineering |
| spellingShingle |
Physical surface engineering A. N. Stervoedov V. M. Beresnev N. V. Sergeeva Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| format |
Article |
| author |
A. N. Stervoedov V. M. Beresnev N. V. Sergeeva |
| author_facet |
A. N. Stervoedov V. M. Beresnev N. V. Sergeeva |
| author_sort |
A. N. Stervoedov |
| title |
Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_short |
Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_full |
Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_fullStr |
Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_full_unstemmed |
Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_sort |
features of x-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| publishDate |
2010 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000877899 |
| work_keys_str_mv |
AT anstervoedov featuresofxrayphotoelectronspectroscopyfordeterminingthethicknessofultrathinfilms AT vmberesnev featuresofxrayphotoelectronspectroscopyfordeterminingthethicknessofultrathinfilms AT nvsergeeva featuresofxrayphotoelectronspectroscopyfordeterminingthethicknessofultrathinfilms |
| first_indexed |
2024-04-18T05:47:33Z |
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2024-04-18T05:47:33Z |
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