Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films
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| Date: | 2010 |
|---|---|
| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
2010
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| Series: | Physical surface engineering |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000877899 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859603787551866880 |
|---|---|
| author | A. N. Stervoedov V. M. Beresnev N. V. Sergeeva |
| author_facet | A. N. Stervoedov V. M. Beresnev N. V. Sergeeva |
| author_sort | A. N. Stervoedov |
| collection | Open-Science |
| first_indexed | 2025-07-22T15:43:54Z |
| format | Article |
| id | open-sciencenbuvgovua-101750 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T15:43:54Z |
| publishDate | 2010 |
| record_format | dspace |
| series | Physical surface engineering |
| spelling | open-sciencenbuvgovua-1017502024-04-17T18:06:51Z Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films A. N. Stervoedov V. M. Beresnev N. V. Sergeeva 1999-8074 2010 en Physical surface engineering http://jnas.nbuv.gov.ua/article/UJRN-0000877899 Article |
| spellingShingle | Physical surface engineering A. N. Stervoedov V. M. Beresnev N. V. Sergeeva Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title | Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_full | Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_fullStr | Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_full_unstemmed | Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_short | Features of X-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| title_sort | features of x-ray photoelectron spectroscopy for determining the thickness of ultrathin films |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000877899 |
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