Photometric monitoring of etching rate of thin dielectric films

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Bibliographische Detailangaben
Datum:2006
Hauptverfasser: S. E. Semenova, E. I. Semenov
Format: Artikel
Sprache:Englisch
Veröffentlicht: 2006
Schriftenreihe:Technology and design in electronic equipment
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000455196
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author S. E. Semenova
E. I. Semenov
author_facet S. E. Semenova
E. I. Semenov
author_sort S. E. Semenova
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institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
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spelling open-sciencenbuvgovua-1049312024-04-17T18:56:04Z Photometric monitoring of etching rate of thin dielectric films S. E. Semenova E. I. Semenov 2225-5818 2006 en Technology and design in electronic equipment http://jnas.nbuv.gov.ua/article/UJRN-0000455196 Article
spellingShingle Technology and design in electronic equipment
S. E. Semenova
E. I. Semenov
Photometric monitoring of etching rate of thin dielectric films
title Photometric monitoring of etching rate of thin dielectric films
title_full Photometric monitoring of etching rate of thin dielectric films
title_fullStr Photometric monitoring of etching rate of thin dielectric films
title_full_unstemmed Photometric monitoring of etching rate of thin dielectric films
title_short Photometric monitoring of etching rate of thin dielectric films
title_sort photometric monitoring of etching rate of thin dielectric films
url http://jnas.nbuv.gov.ua/article/UJRN-0000455196
work_keys_str_mv AT sesemenova photometricmonitoringofetchingrateofthindielectricfilms
AT eisemenov photometricmonitoringofetchingrateofthindielectricfilms