Reshetnjak, M. V., & Sobol, O. V. (2008). Nhancement of structure and substructure analysis of W2B5-TiB2 quasi-binary nano-crystalline condensed and bulk materials with application of "new_profile" soft-ware for x-ray diffraction data treatment.
Chicago Style (17th ed.) CitationReshetnjak, M. V., and O. V. Sobol. Nhancement of Structure and Substructure Analysis of W2B5-TiB2 Quasi-binary Nano-crystalline Condensed and Bulk Materials with Application of "new_profile" Soft-ware for X-ray Diffraction Data Treatment. 2008.
MLA (8th ed.) CitationReshetnjak, M. V., and O. V. Sobol. Nhancement of Structure and Substructure Analysis of W2B5-TiB2 Quasi-binary Nano-crystalline Condensed and Bulk Materials with Application of "new_profile" Soft-ware for X-ray Diffraction Data Treatment. 2008.