The structural-phase composition in CoSb1,82-5,45 (30 nm)-SiO2 (100 nm)-Si (001) nanoscaled film compositions after deposition and annealings - Ju. N. Makogon; E. P. Pavlova; S. I. Sidorenko; G. Beddis; M. Daniel; T. I. Verbitskaja; R. A. Shkarban; S. E. Bogdanov (Modern Problems in Physical Materials Science, 2010)