Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics

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Datum:2024
Hauptverfasser: V. K. Gavrikov, L. M. Lytvynenko, V. V. Myshenko, O. V. Polikarpov, A. M. Korolev, D. L. Chechotkin, I. S. Spevak
Format: Artikel
Sprache:English
Veröffentlicht: 2024
Schriftenreihe:Radio Physics and Radio Astronomy
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0001495753
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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-1125612024-12-23T18:40:57Z Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics V. K. Gavrikov L. M. Lytvynenko V. V. Myshenko O. V. Polikarpov A. M. Korolev D. L. Chechotkin I. S. Spevak 1027-9636 2024 en Radio Physics and Radio Astronomy http://jnas.nbuv.gov.ua/article/UJRN-0001495753 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Radio Physics and Radio Astronomy
spellingShingle Radio Physics and Radio Astronomy
V. K. Gavrikov
L. M. Lytvynenko
V. V. Myshenko
O. V. Polikarpov
A. M. Korolev
D. L. Chechotkin
I. S. Spevak
Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
format Article
author V. K. Gavrikov
L. M. Lytvynenko
V. V. Myshenko
O. V. Polikarpov
A. M. Korolev
D. L. Chechotkin
I. S. Spevak
author_facet V. K. Gavrikov
L. M. Lytvynenko
V. V. Myshenko
O. V. Polikarpov
A. M. Korolev
D. L. Chechotkin
I. S. Spevak
author_sort V. K. Gavrikov
title Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
title_short Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
title_full Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
title_fullStr Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
title_full_unstemmed Ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
title_sort ways for reducing the errors of dielectric constant measurements at millimeter and submillimeter wavelengths within the surface plasmon resonance technique as applied to weakly absorbent dielectrics
publishDate 2024
url http://jnas.nbuv.gov.ua/article/UJRN-0001495753
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first_indexed 2025-07-22T18:55:31Z
last_indexed 2025-07-22T18:55:31Z
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