Mikheev, V. M. (2019). Concentration maxima of the mobility of 2D electrons scattered by correlated impurity ions in thin doped layers.
Chicago-Zitierstil (17. Ausg.)Mikheev, V. M. Concentration Maxima of the Mobility of 2D Electrons Scattered by Correlated Impurity Ions in Thin Doped Layers. 2019.
MLA-Zitierstil (8. Ausg.)Mikheev, V. M. Concentration Maxima of the Mobility of 2D Electrons Scattered by Correlated Impurity Ions in Thin Doped Layers. 2019.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.