Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
Збережено в:
Дата: | 2019 |
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Автор: | |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
2019
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Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0001000431 |
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Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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open-sciencenbuvgovua-183222024-02-26T22:00:13Z Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes A. Latreche 1560-8034 2019 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0001000431 Article |
institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
collection |
Open-Science |
language |
English |
series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics A. Latreche Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
format |
Article |
author |
A. Latreche |
author_facet |
A. Latreche |
author_sort |
A. Latreche |
title |
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
title_short |
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
title_full |
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
title_fullStr |
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
title_full_unstemmed |
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes |
title_sort |
combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4h-sic schottky barrier diodes |
publishDate |
2019 |
url |
http://jnas.nbuv.gov.ua/article/UJRN-0001000431 |
work_keys_str_mv |
AT alatreche combinationofthermionicemissionandtunnelingmechanismstoanalyzetheleakagecurrentin4hsicschottkybarrierdiodes |
first_indexed |
2024-03-30T07:35:07Z |
last_indexed |
2024-03-30T07:35:07Z |
_version_ |
1796879180442370048 |