Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes

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Datum:2019
1. Verfasser: A. Latreche
Format: Artikel
Sprache:Englisch
Veröffentlicht: 2019
Schriftenreihe:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0001000431
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author A. Latreche
author_facet A. Latreche
author_sort A. Latreche
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institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
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publishDate 2019
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series Semiconductor Physics, Quantum Electronics and Optoelectronics
spelling open-sciencenbuvgovua-183222024-02-26T22:00:13Z Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes A. Latreche 1560-8034 2019 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0001000431 Article
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
A. Latreche
Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title_full Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title_fullStr Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title_full_unstemmed Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title_short Combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4H-SiC Schottky barrier diodes
title_sort combination of thermionic emission and tunneling mechanisms to analyze the leakage current in 4h-sic schottky barrier diodes
url http://jnas.nbuv.gov.ua/article/UJRN-0001000431
work_keys_str_mv AT alatreche combinationofthermionicemissionandtunnelingmechanismstoanalyzetheleakagecurrentin4hsicschottkybarrierdiodes