Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data - M. D. Borcha; M. S. Solodkyi; S. V. Balovsyak; V. M. Tkach; I. I. Hutsuliak; A. R. Kuzmin; O. O. Tkach; V. P. Kladko; Yo. Gudymenko; O. I. Liubchenko (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2019)