Island photonic structures: Properties and application in sensing and metrology

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Бібліографічні деталі
Дата:2019
Автори: Ya. Glushko, A. N. Stepanyuk
Формат: Стаття
Мова:English
Опубліковано: 2019
Назва видання:Semiconductor Physics, Quantum Electronics and Optoelectronics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001073943
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-227752024-02-26T22:24:40Z Island photonic structures: Properties and application in sensing and metrology Ya. Glushko A. N. Stepanyuk 1560-8034 2019 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0001073943 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
Ya. Glushko
A. N. Stepanyuk
Island photonic structures: Properties and application in sensing and metrology
format Article
author Ya. Glushko
A. N. Stepanyuk
author_facet Ya. Glushko
A. N. Stepanyuk
author_sort Ya. Glushko
title Island photonic structures: Properties and application in sensing and metrology
title_short Island photonic structures: Properties and application in sensing and metrology
title_full Island photonic structures: Properties and application in sensing and metrology
title_fullStr Island photonic structures: Properties and application in sensing and metrology
title_full_unstemmed Island photonic structures: Properties and application in sensing and metrology
title_sort island photonic structures: properties and application in sensing and metrology
publishDate 2019
url http://jnas.nbuv.gov.ua/article/UJRN-0001073943
work_keys_str_mv AT yaglushko islandphotonicstructurespropertiesandapplicationinsensingandmetrology
AT anstepanyuk islandphotonicstructurespropertiesandapplicationinsensingandmetrology
first_indexed 2024-03-30T07:55:33Z
last_indexed 2024-03-30T07:55:33Z
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