Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods

Збережено в:
Бібліографічні деталі
Дата:2022
Автори: S. I. Drapak, S. V. Gavrylyuk, Y. B. Khalavka, V. D. Fotiy, P. M. Fochuk, O. I. Fediv
Формат: Стаття
Мова:English
Опубліковано: 2022
Назва видання:Ukrainian journal of physics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001377604
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!

Репозиторії

Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-2460
record_format dspace
spelling open-sciencenbuvgovua-24602023-09-12T18:01:05Z Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods S. I. Drapak S. V. Gavrylyuk Y. B. Khalavka V. D. Fotiy P. M. Fochuk O. I. Fediv 2071-0186 2022 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0001377604 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian journal of physics
spellingShingle Ukrainian journal of physics
S. I. Drapak
S. V. Gavrylyuk
Y. B. Khalavka
V. D. Fotiy
P. M. Fochuk
O. I. Fediv
Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
format Article
author S. I. Drapak
S. V. Gavrylyuk
Y. B. Khalavka
V. D. Fotiy
P. M. Fochuk
O. I. Fediv
author_facet S. I. Drapak
S. V. Gavrylyuk
Y. B. Khalavka
V. D. Fotiy
P. M. Fochuk
O. I. Fediv
author_sort S. I. Drapak
title Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_short Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_full Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_fullStr Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_full_unstemmed Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_sort characterization of nanostructured in6se7 inclusions in layered α-in2se3 crystals using analytical x-ray diffractometry methods
publishDate 2022
url http://jnas.nbuv.gov.ua/article/UJRN-0001377604
work_keys_str_mv AT sidrapak characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT svgavrylyuk characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT ybkhalavka characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT vdfotiy characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT pmfochuk characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT oifediv characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
first_indexed 2023-06-08T19:28:23Z
last_indexed 2023-09-24T18:02:32Z
_version_ 1796877523377717248