Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods - S. I. Drapak; S. V. Gavrylyuk; Y. B. Khalavka; V. D. Fotiy; P. M. Fochuk; O. I. Fediv (Ukrainian journal of physics, 2022)