Drapak, S. I., Havryliuk, S. V., Khalavka, Y. B., Fotii, V. D., Fochuk, P. M., & Fediv, O. I. (2022). Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods.
Chicago-Zitierstil (17. Ausg.)Drapak, S. I., S. V. Havryliuk, Yu. B. Khalavka, V. D. Fotii, P. M. Fochuk, und O. I. Fediv. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-ray Diffractometry Methods. 2022.
MLA-Zitierstil (8. Ausg.)Drapak, S. I., et al. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-ray Diffractometry Methods. 2022.
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