APA (7th ed.) Citation

Drapak, S. I., Havryliuk, S. V., Khalavka, Y. B., Fotii, V. D., Fochuk, P. M., & Fediv, O. I. (2022). Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods.

Chicago Style (17th ed.) Citation

Drapak, S. I., S. V. Havryliuk, Yu. B. Khalavka, V. D. Fotii, P. M. Fochuk, and O. I. Fediv. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-ray Diffractometry Methods. 2022.

MLA (8th ed.) Citation

Drapak, S. I., et al. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-ray Diffractometry Methods. 2022.

Warning: These citations may not always be 100% accurate.