Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods

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Бібліографічні деталі
Дата:2022
Автори: S. I. Drapak, S. V. Havryliuk, Yu. B. Khalavka, V. D. Fotii, P. M. Fochuk, O. I. Fediv
Формат: Стаття
Мова:English
Опубліковано: 2022
Назва видання:Ukrainian Journal of Physics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001377662
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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record_format dspace
spelling open-sciencenbuvgovua-24852023-09-12T18:01:07Z Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods S. I. Drapak S. V. Havryliuk Yu. B. Khalavka V. D. Fotii P. M. Fochuk O. I. Fediv 0372-400X 2022 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0001377662 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian Journal of Physics
spellingShingle Ukrainian Journal of Physics
S. I. Drapak
S. V. Havryliuk
Yu. B. Khalavka
V. D. Fotii
P. M. Fochuk
O. I. Fediv
Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
format Article
author S. I. Drapak
S. V. Havryliuk
Yu. B. Khalavka
V. D. Fotii
P. M. Fochuk
O. I. Fediv
author_facet S. I. Drapak
S. V. Havryliuk
Yu. B. Khalavka
V. D. Fotii
P. M. Fochuk
O. I. Fediv
author_sort S. I. Drapak
title Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_short Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_full Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_fullStr Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_full_unstemmed Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
title_sort characterization of nanostructured in6se7 inclusions in layered α-in2se3 crystals using analytical x-ray diffractometry methods
publishDate 2022
url http://jnas.nbuv.gov.ua/article/UJRN-0001377662
work_keys_str_mv AT sidrapak characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT svhavryliuk characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT yubkhalavka characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT vdfotii characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT pmfochuk characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
AT oifediv characterizationofnanostructuredin6se7inclusionsinlayeredain2se3crystalsusinganalyticalxraydiffractometrymethods
first_indexed 2025-07-17T10:42:25Z
last_indexed 2025-07-17T10:42:25Z
_version_ 1850410837073723392