Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
Збережено в:
| Дата: | 2022 |
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| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2022
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| Назва видання: | Ukrainian Journal of Physics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0001377662 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859480822019522560 |
|---|---|
| author | S. I. Drapak S. V. Havryliuk Yu. B. Khalavka V. D. Fotii P. M. Fochuk O. I. Fediv |
| author_facet | S. I. Drapak S. V. Havryliuk Yu. B. Khalavka V. D. Fotii P. M. Fochuk O. I. Fediv |
| author_sort | S. I. Drapak |
| collection | Open-Science |
| first_indexed | 2025-07-17T10:42:25Z |
| format | Article |
| id | open-sciencenbuvgovua-2485 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T10:42:25Z |
| publishDate | 2022 |
| record_format | dspace |
| series | Ukrainian Journal of Physics |
| spelling | open-sciencenbuvgovua-24852023-09-12T18:01:07Z Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods S. I. Drapak S. V. Havryliuk Yu. B. Khalavka V. D. Fotii P. M. Fochuk O. I. Fediv 0372-400X 2022 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0001377662 Article |
| spellingShingle | Ukrainian Journal of Physics S. I. Drapak S. V. Havryliuk Yu. B. Khalavka V. D. Fotii P. M. Fochuk O. I. Fediv Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title | Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title_full | Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title_fullStr | Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title_full_unstemmed | Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title_short | Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods |
| title_sort | characterization of nanostructured in6se7 inclusions in layered α-in2se3 crystals using analytical x-ray diffractometry methods |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0001377662 |
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