Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
Saved in:
| Date: | 2022 |
|---|---|
| Main Authors: | S. I. Drapak, S. V. Havryliuk, Yu. B. Khalavka, V. D. Fotii, P. M. Fochuk, O. I. Fediv |
| Format: | Article |
| Language: | English |
| Published: |
2022
|
| Series: | Ukrainian Journal of Physics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0001377662 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
by: S. I. Drapak, et al.
Published: (2022) -
Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії
by: Drapak, S.I., et al.
Published: (2022) -
X-ray characterization of ZnSe single crystals doped with Mg
by: Fedorov, A.G., et al.
Published: (2001) -
Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry
by: A. I. Gudymenko, et al.
Published: (2015) -
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
by: Molodkin, V.B., et al.
Published: (2016)