Bacherikov, Y. Y., Dmitruk, N. L., Konakova, R. V., Kolomys, O. F., Okhrimenko, O. B., Strelchuk, V. V., . . . Svetlichnyi, A. M. (2018). Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates.
Chicago Style (17th ed.) CitationBacherikov, Yu. Yu., N. L. Dmitruk, R. V. Konakova, O. F. Kolomys, O. B. Okhrimenko, V. V. Strelchuk, O. S. Lytvyn, L. M. Kapitanchuk, and A. M. Svetlichnyi. Comparison of Properties Inherent to Thin Titanium Oxide Films Formed by Rapid Thermal Annealing on SiC and Porous SiC Substrates. 2018.
MLA (8th ed.) CitationBacherikov, Yu. Yu., et al. Comparison of Properties Inherent to Thin Titanium Oxide Films Formed by Rapid Thermal Annealing on SiC and Porous SiC Substrates. 2018.