Bacherikov, Y. Y., Dmitruk, N. L., Konakova, R. V., Kolomys, O. F., Okhrimenko, O. B., Strelchuk, V. V., . . . Svetlichnyi, A. M. (2018). Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates.
Чикаго стиль цитування (17-те видання)Bacherikov, Yu. Yu., N. L. Dmitruk, R. V. Konakova, O. F. Kolomys, O. B. Okhrimenko, V. V. Strelchuk, O. S. Lytvyn, L. M. Kapitanchuk, та A. M. Svetlichnyi. Comparison of Properties Inherent to Thin Titanium Oxide Films Formed by Rapid Thermal Annealing on SiC and Porous SiC Substrates. 2018.
Стиль цитування MLA (8-ме видання)Bacherikov, Yu. Yu., et al. Comparison of Properties Inherent to Thin Titanium Oxide Films Formed by Rapid Thermal Annealing on SiC and Porous SiC Substrates. 2018.