Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates - Yu. Yu. Bacherikov; N. L. Dmitruk; R. V. Konakova; O. F. Kolomys; O. B. Okhrimenko; V. V. Strelchuk; O. S. Lytvyn; L. M. Kapitanchuk; A. M. Svetlichnyi (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2018)