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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates

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Bibliographic Details
Date:	2018
Main Authors:	Yu. Yu. Bacherikov, N. L. Dmitruk, R. V. Konakova, O. F. Kolomys, O. B. Okhrimenko, V. V. Strelchuk, O. S. Lytvyn, L. M. Kapitanchuk, A. M. Svetlichnyi
Format:	Article
Language:	English
Published:	2018
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000899779
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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