Tatyanenko, N. P., Roshchina, N. N., Gromashevskii, V. L., Svechnikov, G. S., Zavyalova, L. V., & Snopok, B. A. (2018). Semiconductor surface spectroscopy using transverse acousto-electric effect: Role of surface charge in photo-processes at ZnS/Si interface.
Chicago-Zitierstil (17. Ausg.)Tatyanenko, N. P., N. N. Roshchina, V. L. Gromashevskii, G. S. Svechnikov, L. V. Zavyalova, und B. A. Snopok. Semiconductor Surface Spectroscopy Using Transverse Acousto-electric Effect: Role of Surface Charge in Photo-processes at ZnS/Si Interface. 2018.
MLA-Zitierstil (8. Ausg.)Tatyanenko, N. P., et al. Semiconductor Surface Spectroscopy Using Transverse Acousto-electric Effect: Role of Surface Charge in Photo-processes at ZnS/Si Interface. 2018.
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