Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing

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Бібліографічні деталі
Дата:2018
Автори: M. M. Krasko, A. H. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rohutskyi
Формат: Стаття
Мова:English
Опубліковано: 2018
Назва видання:Ukrainian Journal of Physics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000940845
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-298112024-02-27T21:57:31Z Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing M. M. Krasko A. H. Kolosiuk V. V. Voitovych Yu. Povarchuk I. S. Rohutskyi 0372-400X 2018 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0000940845 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian Journal of Physics
spellingShingle Ukrainian Journal of Physics
M. M. Krasko
A. H. Kolosiuk
V. V. Voitovych
Yu. Povarchuk
I. S. Rohutskyi
Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
format Article
author M. M. Krasko
A. H. Kolosiuk
V. V. Voitovych
Yu. Povarchuk
I. S. Rohutskyi
author_facet M. M. Krasko
A. H. Kolosiuk
V. V. Voitovych
Yu. Povarchuk
I. S. Rohutskyi
author_sort M. M. Krasko
title Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
title_short Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
title_full Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
title_fullStr Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
title_full_unstemmed Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing
title_sort influence of divacancy-oxygen defects on recombination properties of n-si subjected to irradiation and subsequent annealing
publishDate 2018
url http://jnas.nbuv.gov.ua/article/UJRN-0000940845
work_keys_str_mv AT mmkrasko influenceofdivacancyoxygendefectsonrecombinationpropertiesofnsisubjectedtoirradiationandsubsequentannealing
AT ahkolosiuk influenceofdivacancyoxygendefectsonrecombinationpropertiesofnsisubjectedtoirradiationandsubsequentannealing
AT vvvoitovych influenceofdivacancyoxygendefectsonrecombinationpropertiesofnsisubjectedtoirradiationandsubsequentannealing
AT yupovarchuk influenceofdivacancyoxygendefectsonrecombinationpropertiesofnsisubjectedtoirradiationandsubsequentannealing
AT isrohutskyi influenceofdivacancyoxygendefectsonrecombinationpropertiesofnsisubjectedtoirradiationandsubsequentannealing
first_indexed 2024-03-30T08:28:13Z
last_indexed 2024-03-30T08:28:13Z
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