Gorskij, P. V. (2018). Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness.
Chicago Style (17th ed.) CitationGorskij, P. V. Imation of the Electrical and Thermal Contact Rsistances and Thermoemf of "thermoelectric Material-metal" Transient Contact Layer Due to Semiconductor Surface Roughness. 2018.
MLA (8th ed.) CitationGorskij, P. V. Imation of the Electrical and Thermal Contact Rsistances and Thermoemf of "thermoelectric Material-metal" Transient Contact Layer Due to Semiconductor Surface Roughness. 2018.
Warning: These citations may not always be 100% accurate.