Gorskij, P. V. (2018). Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness.
Chicago-Zitierstil (17. Ausg.)Gorskij, P. V. Imation of the Electrical and Thermal Contact Rsistances and Thermoemf of "thermoelectric Material-metal" Transient Contact Layer Due to Semiconductor Surface Roughness. 2018.
MLA-Zitierstil (8. Ausg.)Gorskij, P. V. Imation of the Electrical and Thermal Contact Rsistances and Thermoemf of "thermoelectric Material-metal" Transient Contact Layer Due to Semiconductor Surface Roughness. 2018.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.