Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness

Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness

Збережено в:
Бібліографічні деталі
Дата:2018
Автор: P. V. Gorskij
Формат: Стаття
Мова:English
Опубліковано: 2018
Назва видання:Journal of Thermoelectricity
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001094146
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Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-34449
record_format dspace
spelling open-sciencenbuvgovua-344492024-02-27T22:16:35Z Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness P. V. Gorskij 1726-7692 2018 en Journal of Thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0001094146 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Journal of Thermoelectricity
spellingShingle Journal of Thermoelectricity
P. V. Gorskij
Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
format Article
author P. V. Gorskij
author_facet P. V. Gorskij
author_sort P. V. Gorskij
title Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
title_short Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
title_full Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
title_fullStr Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
title_full_unstemmed Imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
title_sort imation of the electrical and thermal contact rsistances and thermoemf of "thermoelectric material-metal" transient contact layer due to semiconductor surface roughness
publishDate 2018
url http://jnas.nbuv.gov.ua/article/UJRN-0001094146
work_keys_str_mv AT pvgorskij imationoftheelectricalandthermalcontactrsistancesandthermoemfofquotthermoelectricmaterialmetalquottransientcontactlayerduetosemiconductorsurfaceroughness
first_indexed 2024-03-30T08:50:38Z
last_indexed 2024-03-30T08:50:38Z
_version_ 1796880865918189568

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