Impact of traps on current-voltage characteristic of n+-n-n+ diode

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Datum:2017
1. Verfasser: P. M. Kruglenko
Format: Artikel
Sprache:Englisch
Veröffentlicht: 2017
Schriftenreihe:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000741627
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author P. M. Kruglenko
author_facet P. M. Kruglenko
author_sort P. M. Kruglenko
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spelling open-sciencenbuvgovua-372182024-02-29T11:36:03Z Impact of traps on current-voltage characteristic of n+-n-n+ diode P. M. Kruglenko 1560-8034 2017 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000741627 Article
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
P. M. Kruglenko
Impact of traps on current-voltage characteristic of n+-n-n+ diode
title Impact of traps on current-voltage characteristic of n+-n-n+ diode
title_full Impact of traps on current-voltage characteristic of n+-n-n+ diode
title_fullStr Impact of traps on current-voltage characteristic of n+-n-n+ diode
title_full_unstemmed Impact of traps on current-voltage characteristic of n+-n-n+ diode
title_short Impact of traps on current-voltage characteristic of n+-n-n+ diode
title_sort impact of traps on current-voltage characteristic of n+-n-n+ diode
url http://jnas.nbuv.gov.ua/article/UJRN-0000741627
work_keys_str_mv AT pmkruglenko impactoftrapsoncurrentvoltagecharacteristicofnnndiode