Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures - Yu. Yu. Bacherikov; R. V. Konakova; O. B. Okhrimenko; N. I. Berezovska; L. M. Kapitanchuk; A. M. Svetlichnyi (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2017)