Ponomaryov, S. S., Yukhymchuk, V. O., & Valakh, Y. (2016). Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy.
Chicago-Zitierstil (17. Ausg.)Ponomaryov, S. S., V. O. Yukhymchuk, und Ya Valakh. Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy. 2016.
MLA-Zitierstil (8. Ausg.)Ponomaryov, S. S., et al. Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy. 2016.
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