APA (7th ed.) Citation

Ponomaryov, S. S., Yukhymchuk, V. O., & Valakh, Y. (2016). Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy.

Chicago Style (17th ed.) Citation

Ponomaryov, S. S., V. O. Yukhymchuk, and Ya Valakh. Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy. 2016.

MLA (8th ed.) Citation

Ponomaryov, S. S., et al. Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy. 2016.

Warning: These citations may not always be 100% accurate.