Pekar, G. S., Singaevsky, A. A., & Singaevsky, A. F. (2016). Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals.
Chicago-Zitierstil (17. Ausg.)Pekar, G. S., A. A. Singaevsky, und A. F. Singaevsky. Automated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals. 2016.
MLA-Zitierstil (8. Ausg.)Pekar, G. S., et al. Automated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals. 2016.
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