Pekar, G. S., Singaevsky, A. A., & Singaevsky, A. F. (2016). Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals.
Chicago Style (17th ed.) CitationPekar, G. S., A. A. Singaevsky, and A. F. Singaevsky. Automated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals. 2016.
MLA (8th ed.) CitationPekar, G. S., et al. Automated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals. 2016.
Warning: These citations may not always be 100% accurate.