Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals

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Datum:2016
Hauptverfasser: G. S. Pekar, A. A. Singaevsky, A. F. Singaevsky
Format: Artikel
Sprache:English
Veröffentlicht: 2016
Schriftenreihe:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000714528
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-521962024-02-29T13:05:10Z Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals G. S. Pekar A. A. Singaevsky A. F. Singaevsky 1560-8034 2016 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000714528 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
G. S. Pekar
A. A. Singaevsky
A. F. Singaevsky
Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
format Article
author G. S. Pekar
A. A. Singaevsky
A. F. Singaevsky
author_facet G. S. Pekar
A. A. Singaevsky
A. F. Singaevsky
author_sort G. S. Pekar
title Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
title_short Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
title_full Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
title_fullStr Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
title_full_unstemmed Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
title_sort automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals
publishDate 2016
url http://jnas.nbuv.gov.ua/article/UJRN-0000714528
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AT aasingaevsky automatedmethodfordeterminingtheetchpitsdensityoncrystallographicplanesoflargesemiconductorcrystals
AT afsingaevsky automatedmethodfordeterminingtheetchpitsdensityoncrystallographicplanesoflargesemiconductorcrystals
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