The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures

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Бібліографічні деталі
Дата:2016
Автори: V. A. Ievtukh, V. V. Ulyanov, A. N. Nazarov
Формат: Стаття
Мова:English
Опубліковано: 2016
Назва видання:Semiconductor Physics, Quantum Electronics and Optoelectronics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000714544
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-522122024-02-29T13:05:18Z The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures V. A. Ievtukh V. V. Ulyanov A. N. Nazarov 1560-8034 2016 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000714544 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
V. A. Ievtukh
V. V. Ulyanov
A. N. Nazarov
The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
format Article
author V. A. Ievtukh
V. V. Ulyanov
A. N. Nazarov
author_facet V. A. Ievtukh
V. V. Ulyanov
A. N. Nazarov
author_sort V. A. Ievtukh
title The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
title_short The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
title_full The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
title_fullStr The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
title_full_unstemmed The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
title_sort charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures
publishDate 2016
url http://jnas.nbuv.gov.ua/article/UJRN-0000714544
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first_indexed 2024-03-30T10:16:24Z
last_indexed 2024-03-30T10:16:24Z
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