Shafranyuk, V. P. (2016). Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry.
Chicago-Zitierstil (17. Ausg.)Shafranyuk, V. P. Study of Damaged Layer Depth in Thermoelectric Materials by X-ray Diffraction Interferometry. 2016.
MLA-Zitierstil (8. Ausg.)Shafranyuk, V. P. Study of Damaged Layer Depth in Thermoelectric Materials by X-ray Diffraction Interferometry. 2016.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.