Shafranyuk, V. P. (2016). Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry.
Chicago Style (17th ed.) CitationShafranyuk, V. P. Study of Damaged Layer Depth in Thermoelectric Materials by X-ray Diffraction Interferometry. 2016.
MLA (8th ed.) CitationShafranyuk, V. P. Study of Damaged Layer Depth in Thermoelectric Materials by X-ray Diffraction Interferometry. 2016.
Warning: These citations may not always be 100% accurate.