Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

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Datum:2016
1. Verfasser: V. P. Shafranyuk
Format: Artikel
Sprache:English
Veröffentlicht: 2016
Schriftenreihe:Journal of thermoelectricity
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000734006
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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-525962024-02-29T13:07:30Z Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry V. P. Shafranyuk 1607-8829 2016 en Journal of thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0000734006 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Journal of thermoelectricity
spellingShingle Journal of thermoelectricity
V. P. Shafranyuk
Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
format Article
author V. P. Shafranyuk
author_facet V. P. Shafranyuk
author_sort V. P. Shafranyuk
title Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_short Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_fullStr Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full_unstemmed Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_sort study of damaged layer depth in thermoelectric materials by x-ray diffraction interferometry
publishDate 2016
url http://jnas.nbuv.gov.ua/article/UJRN-0000734006
work_keys_str_mv AT vpshafranyuk studyofdamagedlayerdepthinthermoelectricmaterialsbyxraydiffractioninterferometry
first_indexed 2025-07-17T23:06:59Z
last_indexed 2025-07-17T23:06:59Z
_version_ 1850416740875370496