2025-02-23T11:24:37-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-52596%22&qt=morelikethis&rows=5
2025-02-23T11:24:37-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-52596%22&qt=morelikethis&rows=5
2025-02-23T11:24:37-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T11:24:37-05:00 DEBUG: Deserialized SOLR response
Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

Saved in:
Bibliographic Details
Main Author: V. P. Shafranyuk
Format: Article
Language:English
Published: 2016
Series:Journal of thermoelectricity
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000734006
Tags: Add Tag
No Tags, Be the first to tag this record!
id open-sciencenbuvgovua-52596
record_format dspace
spelling open-sciencenbuvgovua-525962024-02-29T13:07:30Z Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry V. P. Shafranyuk 1607-8829 2016 en Journal of thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0000734006 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Journal of thermoelectricity
spellingShingle Journal of thermoelectricity
V. P. Shafranyuk
Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
format Article
author V. P. Shafranyuk
author_facet V. P. Shafranyuk
author_sort V. P. Shafranyuk
title Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_short Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_fullStr Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full_unstemmed Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_sort study of damaged layer depth in thermoelectric materials by x-ray diffraction interferometry
publishDate 2016
url http://jnas.nbuv.gov.ua/article/UJRN-0000734006
work_keys_str_mv AT vpshafranyuk studyofdamagedlayerdepthinthermoelectricmaterialsbyxraydiffractioninterferometry
first_indexed 2024-03-30T10:18:07Z
last_indexed 2024-03-30T10:18:07Z
_version_ 1796882761759326208

Similar Items