Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
Збережено в:
| Дата: | 2016 |
|---|---|
| Автор: | |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2016
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| Назва видання: | Journal of thermoelectricity |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000734006 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859516497956700160 |
|---|---|
| author | V. P. Shafranyuk |
| author_facet | V. P. Shafranyuk |
| author_sort | V. P. Shafranyuk |
| collection | Open-Science |
| first_indexed | 2025-07-17T23:06:59Z |
| format | Article |
| id | open-sciencenbuvgovua-52596 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T23:06:59Z |
| publishDate | 2016 |
| record_format | dspace |
| series | Journal of thermoelectricity |
| spelling | open-sciencenbuvgovua-525962024-02-29T13:07:30Z Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry V. P. Shafranyuk 1607-8829 2016 en Journal of thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0000734006 Article |
| spellingShingle | Journal of thermoelectricity V. P. Shafranyuk Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title | Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title_full | Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title_fullStr | Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title_full_unstemmed | Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title_short | Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry |
| title_sort | study of damaged layer depth in thermoelectric materials by x-ray diffraction interferometry |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000734006 |
| work_keys_str_mv | AT vpshafranyuk studyofdamagedlayerdepthinthermoelectricmaterialsbyxraydiffractioninterferometry |