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Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

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Bibliographische Detailangaben
Datum:	2016
1. Verfasser:	V. P. Shafranyuk
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	2016
Schriftenreihe:	Journal of thermoelectricity
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000734006
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Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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