Buchumschlag

Research on mechanical stress relaxation in real crystals by X-ray diffraction moire method

Gespeichert in:

Bibliographische Detailangaben
Datum:	2016
1. Verfasser:	V. P. Shafraniuk
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	2016
Schriftenreihe:	Journal of thermoelectricity
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000762951
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

Institution

Library portal of National Academy of Sciences of Ukraine | LibNAS

Ähnliche Einträge

Research on structural perfection of CdSb thermoelectric materials using Kh-ray diffraction methods
von: V. P. Shafraniuk, et al.
Veröffentlicht: (2017)

Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
von: Tkachenko, V.F., et al.
Veröffentlicht: (2014)

Influence of absorption level on mechanisms of Braggdiffracted x-ray beam formation in real silicon crystals
von: Klad'ko, V. P., et al.
Veröffentlicht: (1999)

Growing and X-ray diffraction pattern of single-crystal double phosphate Li₂Mn(PO₃)₄
von: Nagorny, P.G., et al.
Veröffentlicht: (2018)

Residual stresses in Ti₄₁¸₅Zr₄₁¸₅Ni₁₇ quasi-crystalline ribbons measured by X-ray diffraction
von: Malykhin, S.
Veröffentlicht: (2007)

Convolution problems in time-resolved X-ray diffraction
von: S. Bratos, et al.
Veröffentlicht: (2012)

Convolution problems in time-resolved X-ray diffraction
von: S. Bratos, et al.
Veröffentlicht: (2012)

Study of structure perfection of KDP single crystals using the X-ray dynamic diffraction effects
von: Puzikov, V.M., et al.
Veröffentlicht: (2011)

Method of X-ray diffraction data processing for multiphase materials with low phase contents
von: A. D. Scorbun, et al.
Veröffentlicht: (2019)

Method of X-ray diffraction data processing for multiphase materials with low phase contents
von: A. D. Skorbun, et al.
Veröffentlicht: (2019)

The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
von: Bazdyreva, S.V., et al.
Veröffentlicht: (2013)

Crystal structure of dense pseudo-cubic boron allotrope, pc-B₅₂, by powder X-ray diffraction
von: Kurakevych, O.O., et al.
Veröffentlicht: (2013)

Crystal structure of dense pseudo-cubic boron allotrope, pc-B52, by powder X-ray diffraction
von: O. O. Kurakevych, et al.
Veröffentlicht: (2013)

Research on structural perfection of CdSb thermoelectric materials using Kh-ray diffraction methods
von: V. P. Shafranjuk, et al.
Veröffentlicht: (2017)

Simulation of low angle X-ray diffraction on multilayers subjected to diffusion
von: Fedorov, A.G.
Veröffentlicht: (2000)

Hysteretic phenomena in Xe-doped C₆₀ from x-ray diffraction
von: Prokhvatilov, A.I., et al.
Veröffentlicht: (2005)

Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
von: V. P. Shafranyuk
Veröffentlicht: (2016)

X-ray diffraction analysis of the polymorphic transition formed in constant physical fields
von: V. O. Vilenskyi, et al.
Veröffentlicht: (2014)

Raman spectroscopy and X-ray diffraction studies of (GeS₂)₁₀₀₋x(SbSI)x glasses and composites on their basis
von: Rubish, V.M., et al.
Veröffentlicht: (2014)

Microstructure Characterization of Nanocrystalline Ni₅₀Ti₅₀ Alloy Prepared Via Mechanical Alloying Method Using the Rietveld Refinement Method Applied to the X-Ray Diffraction
von: Sakher, E., et al.
Veröffentlicht: (2017)

A method of analysis of the shapes of X-ray diffraction lines not requiring a transition to the space of an object
von: N. M. Rozhenko, et al.
Veröffentlicht: (2019)

The Role of Inhomogeneous Deformation and Correlation of Subsurface Defects in Grazing X-Ray Diffraction
von: Ju. Gaevskij, et al.
Veröffentlicht: (2014)

X-ray diffraction and thermal studies on some food and cosmetic bentonite clays
von: O. I. Oranska, et al.
Veröffentlicht: (2019)

Intercalation of fullerite C₆₀ with N₂ molecules. An investigation by x-ray powder diffraction
von: Galtsov, N.N., et al.
Veröffentlicht: (2007)

Mechanisms of the high-temperature internal stresses relaxation during creep in alkali-halide single crystals
von: Matsokin, V.P., et al.
Veröffentlicht: (2006)

X-ray diffraction study of atomic long-range order of Fe-AI alloy
von: Repetsky, S.P., et al.
Veröffentlicht: (2005)

On the use of model diffraction profiles in the microstructure analysis of nanocrystalline metal oxides based on powder x-ray diffraction data
von: O. I. Oranska, et al.
Veröffentlicht: (2022)

Investigation of the interaction of lithium with n-InSe: spectra of inpedance and X-ray diffraction
von: S. V. Havryliuk, et al.
Veröffentlicht: (2014)

X-ray diffraction method application to assess the energy losses on explosive-rock contact under various blasting
von: I. Kratkovskyi, et al.
Veröffentlicht: (2020)

Raman spectroscopy and X-ray diffraction studies of (GeS2)100-x(SbSI)x glasses and composites on their basis
von: V. M. Rubish, et al.
Veröffentlicht: (2014)

The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration
von: Liu Kejia, et al.
Veröffentlicht: (2016)

X-Ray Diffraction Images of Microscratchings Presented in the Form of Multilane Distributions of Concentrated Forces
von: I. M. Fodchuk, et al.
Veröffentlicht: (2013)

Research of the elastic wave velocity dispersion in X-ray-irradiated LiF crystals
von: G. O. Petchenko, et al.
Veröffentlicht: (2013)

Research of the elastic wave velocity dispersion in X-ray-irradiated LiF crystals
von: H. O. Petchenko, et al.
Veröffentlicht: (2013)

Interlayer Mn–Mn exchange parameter MnPS₃ from x-ray diffraction data
von: Yagotintsev, K.A., et al.
Veröffentlicht: (2012)

Supramolecular organization and electronic structure of perylene tetracarboxylic diimide: X-ray diffraction and theoretical studies
von: Pokropivny, A.
Veröffentlicht: (2010)

X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals
von: Grigas, J., et al.
Veröffentlicht: (2008)

X-ray diffraction investigation of GaN layers on Si(111) and Al₂O₃ (0001) substrates
von: Safriuk, N.V., et al.
Veröffentlicht: (2013)

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
von: V. P. Kladko, et al.
Veröffentlicht: (2010)

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures
von: Kladko, V.P., et al.
Veröffentlicht: (2010)