Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals

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Бібліографічні деталі
Дата:2016
Автори: H. P. Haidar, P. I. Baranskyi
Формат: Стаття
Мова:Англійська
Опубліковано: 2016
Назва видання:Reports of the National Academy of Sciences of Ukraine
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000816047
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author H. P. Haidar
P. I. Baranskyi
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P. I. Baranskyi
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spelling open-sciencenbuvgovua-542982024-02-29T13:15:15Z Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals H. P. Haidar P. I. Baranskyi 1025-6415 2016 en Reports of the National Academy of Sciences of Ukraine http://jnas.nbuv.gov.ua/article/UJRN-0000816047 Article
spellingShingle Reports of the National Academy of Sciences of Ukraine
H. P. Haidar
P. I. Baranskyi
Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title_full Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title_fullStr Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title_full_unstemmed Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title_short Influence of Ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
title_sort influence of ge isovalent impurity and thermoannealings on the electrophysical properties of silicon crystals
url http://jnas.nbuv.gov.ua/article/UJRN-0000816047
work_keys_str_mv AT hphaidar influenceofgeisovalentimpurityandthermoannealingsontheelectrophysicalpropertiesofsiliconcrystals
AT pibaranskyi influenceofgeisovalentimpurityandthermoannealingsontheelectrophysicalpropertiesofsiliconcrystals