Lizunov, V. V., Kochelab, E. V., Skakunova, E. S., Len, E. G., Molodkin, V. B., Olikhovskij, S. I., . . . Skapa, L. N. (2015). The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model.
Chicago Style (17th ed.) CitationLizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. I. Theoretical Model. 2015.
MLA (8th ed.) CitationLizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. I. Theoretical Model. 2015.
Warning: These citations may not always be 100% accurate.