The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

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Bibliographic Details
Date:2015
Main Authors: V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Format: Article
Language:English
Published: 2015
Series:Nanosystems, nanomaterials, nanotechnologies
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000454326
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spelling open-sciencenbuvgovua-601162024-04-16T12:48:00Z The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa 1816-5230 2015 en Nanosystems, nanomaterials, nanotechnologies http://jnas.nbuv.gov.ua/article/UJRN-0000454326 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Nanosystems, nanomaterials, nanotechnologies
spellingShingle Nanosystems, nanomaterials, nanotechnologies
V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
format Article
author V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
author_facet V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
author_sort V. V. Lizunov
title The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
title_short The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
title_full The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
title_fullStr The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
title_full_unstemmed The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
title_sort dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. i. theoretical model
publishDate 2015
url http://jnas.nbuv.gov.ua/article/UJRN-0000454326
work_keys_str_mv AT vvlizunov thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT evkochelab thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT esskakunova thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT eglen thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT vbmolodkin thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT siolikhovskij thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT ngtolmachjov thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT bvsheludchenko thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT svlizunova thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT lnskapa thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT vvlizunov dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT evkochelab dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT esskakunova dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT eglen dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT vbmolodkin dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT siolikhovskij dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT ngtolmachjov dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT bvsheludchenko dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT svlizunova dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
AT lnskapa dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesitheoreticalmodel
first_indexed 2025-07-18T01:55:11Z
last_indexed 2025-07-18T01:55:11Z
_version_ 1850417547941249024

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