The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model
Збережено в:
| Дата: | 2015 |
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| Автори: | , , , , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2015
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| Назва видання: | Nanosystems, nanomaterials, nanotechnologies |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000454326 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-60116 |
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open-sciencenbuvgovua-601162024-04-16T12:48:00Z The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa 1816-5230 2015 en Nanosystems, nanomaterials, nanotechnologies http://jnas.nbuv.gov.ua/article/UJRN-0000454326 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Nanosystems, nanomaterials, nanotechnologies |
| spellingShingle |
Nanosystems, nanomaterials, nanotechnologies V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| format |
Article |
| author |
V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa |
| author_facet |
V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa |
| author_sort |
V. V. Lizunov |
| title |
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| title_short |
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| title_full |
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| title_fullStr |
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| title_full_unstemmed |
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model |
| title_sort |
dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. i. theoretical model |
| publishDate |
2015 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000454326 |
| work_keys_str_mv |
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| first_indexed |
2024-04-17T04:23:21Z |
| last_indexed |
2024-04-17T04:23:21Z |
| _version_ |
1796883547562180608 |