The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model - V. V. Lizunov; E. V. Kochelab; E. S. Skakunova; E. G. Len; V. B. Molodkin; S. I. Olikhovskij; N. G. Tolmachjov; B. V. Sheludchenko; S. V. Lizunova; L. N. Skapa (Nanosystems, nanomaterials, nanotechnologies, 2015)