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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

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Bibliographic Details
Date:	2015
Main Authors:	V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Format:	Article
Language:	English
Published:	2015
Series:	Nanosystems, nanomaterials, nanotechnologies
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000454326
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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